Nano-Rp™

An AFM allows you to directly visualize the three dimensional topography of nanoparticles, as well as to measure nanoparticle size and volume distributions. There is little or no sample preparation required with an AFM. Simply deposit the particles on an activated substrate, place the specimen in the microscope stage and begin scanning. Because the Pacific Nanotechnology AFM is simple to operate, in a few hours you are able to obtain nanoparticle analyses that used to take a few days.

Nano-R2™ Scanning Probe Microscope

This state-of-the-art scanning probe microscope includes everything that is needed for measuring high resolution AFM images. Advanced features include an automated video optical microscope, and automated XY sample translation stage. The scanner included with the Nano-Rp™ includes calibration sensors to assure the highest precision and accuracy measurements.

NanoRule+™/Particle Characterization: After acquiring images of nanoparticles, this software performs image analysis. The particle characterization routines in NanoRule+™; automatically locate nanoparticles in an image and then help to quantify information in the images. Further, the NanoRule+™ software allows creation of 2D and 3D images of nanoparticles.

Included with the Nano-Rp™ is a set of Nanoflat substrates that are used for fixing (anchoring) the nanoparticles while they are being scanned. Three boxes of nanoflat substrates are included with each system. The boxes include one each of the nanoflat substrates.

This training class is meant to help customers get the best results from the Nano-Rp™ product. The class may be taken at any time during the first year of ownership of the Nano-Rp™ . The class includes basic training in the theory and operation of the Nano-Rp™ as well as hands on training to help with specific nanoparticle applications.