Pacific Nanotechnology Inc.
  print now

Advancing Nanoparticles Technology

 

Nano-Rp™

Nano-Rp™ , a complete particle characterization system, is an innovative, easy-to-use, and productive atomic force microscope designed for capturing three-dimensional images of nanoparticles. The state-of-the-art laboratory scanning probe microscope can be used in both EZModeTM and X’pertModeTM . It includes everything required for AFM imaging nanoparticle. An AFM allows you to directly visualize the three dimensional topography of nanoparticles, as well as to measure nanoparticle size and volume distributions. There is little or no sample preparation required with an AFM ......read more

Nanoparticle tutorial
particle characterization with AFM
Accesories and Applications

Pacific Nanotechnology offers applications support to assure your success with our product. Our nanoparticle accessories kit includes everything required for nanoparticle imaging: particle reference sample, nanoflat substrates, NanoRule+™ particle characterization software and three-part applications papers. Several times a year Pacific Nanotechnology offers introductory and advanced training class to assure you get the most from your AFM.The two day training course is intended to help PNI customers learn what is required to scan and analyze nanoparticles with the Nano-Rp™ SPM. The training includes classroom discussions and hands on operation of the Nano-Rp™ SPM.
Nanoparticle Characterization Training Nanoparticle Sample Preparation education in nanoparticle technology

The training cource also includes an introductory lecture on theory of SPM (Scanning Probe Microscope) and covers detailed analysis on Nanoparticle Sample Preparation ,SPM operation and image analysis ......read more

Among the major applications include Nanoparticle Visualization with an AFM and Particle Size Measurements with an AFM


Nanoparticle Technology-Particle Characterization with AFM

Nanoparticle Technology
Atomic Force Microscopy is a very well established technique to characterize surface topography or morphology of individual particles. AFM particle characterization software packages provide comprehensive tools for analyzing nanoparticles. The main objective of this paper is to focus on AFM nanoparticle analysis data interpretation.......read more




NnaoRule+™ particle characterization software provides most efficient way to charecterize AFM nanoparticle data.The Particle Analysis module is an option for NanoRule+™; SPM analysis software and is used for identifying and analyzing particles. There are several provisions for identifying particles. Once identified, many parameters including area, perimeter, height, and length may be calculated. Several options are available for reporting the results from the particle analysis software option......read more



Nano flats
Nanoparticle Products-Nano Flat

Nanoflat substrates are specially prepared for the attachment/fixing of many sizes and shapes of nanoparticles, in order to image these particle dispersions with an AFM. The substrates are pre-mounted on standard AFM sample holders. There are seven Nanoflat substrates and they may be purchased in two formats:.......read more


 

 
3350 Scott Blvd. #29, Santa Clara, CA 95054  |  Phone: 1-800-246-3704  |  Direct: 408-982-9492  |  Fax: 408-982-9151
Copyright 2003 Pacific Nanotechnology, Inc. All Rights Reserved.
Design & website development by WDS Design Group