This two day training course is intended to help PNI customers learn what is required to scan and analyze nanoparticles with the Nano-Rp™ SPM. The training includes classroom discussions and hands on operation of the Nano-Rp™ SPM.
Topics covered in the course include the following:
This introductory lecture includes the theory of scanning probe microscopy, including discussions of the force sensor, piezoelectric ceramics, and feedback control. Additionally, the three primary components of the SPM:
(i) software,
(ii)control electronics, and
(iii) the stage, are presented.
Sample Preparation
The sample preparation techniques necessary for particle characterization are covered in this section of the course. Several types of sample preparation methods are described and demonstrated. Samples prepared in this section are then scanned with the Nano-Rp™ SPM.
SPM Operation
Each student will be given hands on instruction in the operation of the Nano-Rp™ SPM. Instruction in probe approach, scan optimization, and scanning modes is taught. Scanning modes that are presented include both contact and vibrating modes.
Image Analysis
In this section of the course, students are taught how to use NanoRule+™; software to process and analyze nanoparticles. Specific topics covered include the methods of basic image processing so that images are suitably prepared for advanced particle analysis. Advanced particle analysis features for single and multiple particle characterization are presented.
This class is held at the Pacific Nanotechnology corporate office in Santa Clara, California. Included in the course is all of the instructional material and use of the Pacific Nanotechnology SPM instruments. After completing the course, each student receives a certificate of training. Pacific Nanotechnology provides lunch on each day of the course. Students are responsible for their transportation to California, lodging and evening meals.
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