Pacific Nanotechnology Inc.

Advancing Nanoparticles Technology

 

Nanoparticles Newsletter
February 2007


season's greetings

Are you new to AFM? Do you want to learn more about AFM? Pacific Nanotechnology is participating as Instructor in a one-day tutorial at the Spring *MRS. Meeting in San Francisco on Monday, April 9 at Moscone West Convention Center . "Principals and applications of Atomic Force Microscopy" covers the theoretical foundations of AFM, identification and removal of image artifacts, and applications for nanoparticles. Class materials are provided.

 
 


Accurate measurements of nanoparticles require AFM calibration and characterization of tip geometry. These measurement-critical parameters can be resolved with Pacific Nanotechnology's nanoparticle reference sample.

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