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The Nano-Rp™ SPM is optimized for research and development on nanoparticles applications. It may be purchased with both the light lever AFM scanner and the crystal scanner |
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Nano-R2™ is a state of the art atomic force microscope with motorized stage control complementary high-resolution optics and close loop scanner |
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NanoFlat substrates are ready to use substrates for nanoparticle visualisation with AFM ,covers wide range of particle sizes and applications |
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Outline, count, Measure - NanoRule+™ particle characterization software provides most efficient way to charecterize AFM nanoparticle data |
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The PNI particle reference sample is designed for AFM visualization of monodispersed polymer spheres. Nominal diameter of spheres is 100 nm, calibrated with TEM and AFM. The sample is used for establishing measurement methodologies as well as instrument/probe calibration. |
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This two day training course is intended to help PNI customers learn what is required to scan and analyze nanoparticles with the Nano-Rp™ SPM. The training includes classroom discussions and hands on operation of the Nano-Rp™ SPM. |
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